Ballistic Electron Emission Microscopy (BEEM) images

Beem Tutorial
Ballistic Electron Emission Microscopy (BEEM) uses an STM tip to inject ballistic electrons into a sample consisting of at least two layers. The ballistic electrons probe the properties of the interface between the first and second layers of the sample.

The experimental setup is similiar to normal STM, with the addition of a third electrode connected to the second layer. The STM tip tunnels into a thin metal film on top of the semiconductor. A small percentage of these tunnel electrons will tunnel ballistically through the metal film into the semiconductor. A third electrode collects these ballistic electrons.


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Contact info:
Rick Workman
1118 E. 4th St
Tucson, AZ 85721
520-626-9311
rworkman@u.arizona.edu