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Beem Tutorial
Ballistic Electron Emission Microscopy (BEEM) uses an STM tip to inject ballistic electrons into a
sample consisting of at least two layers. The ballistic electrons probe the properties of the
interface between the first and second layers of the sample.
The experimental setup is similiar to normal STM, with the addition of a third electrode connected to
the second layer. The STM tip tunnels into a thin metal film on top of the semiconductor. A small
percentage of these tunnel electrons will tunnel ballistically through the metal film into the semiconductor.
A third electrode collects these ballistic electrons.

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